Tradition, Innovation, and Terroir / Tradition, innovation et terroir
Edited By Giovanni Ceccarelli, Alberto Grandi and Stefano Magagnoli
This book contains articles in English and French.
The inspiration for this book was drawn from the papers presented at the international conference La tipicità nella storia: tradizione, innovazione, territorio (held in Parma and Langhirano in September 2010). Besides those who appear in this book, the editors are grateful to all those who contributed in making it a culturally dense and successful encounter; they wish in particular to mention Maria Emanovskaya, Agnese Portincasa, Rengenier Rittersma, and Sydney Watts – for the papers they presented –, and Salvatore Ciriacono, Nadège Sougy, and Fabio Sforzi – for their active role as discussants. The conference would not have been possible without the support of a number of persons and institutions: Università degli Studi di Parma and its Magnifico Rettore, Fondazione Cassa di Risparmio di Parma, Provincia di Parma, Dipartimento di economia dell’Università di Parma, Academia Barilla, Camera di Commercio di Parma, Accademia Italiana della Cucina, Consorzio del Parmigiano-Reggiano, Fiere di Parma, Comune di Langhirano, Festival del Prosciutto di Parma, Musei del Cibo di Parma, Comune di Parma, and Regione Emilia- Romagna. Thanks to Stefania Portioli for the assistance in organizing the conference, to Anna Pacchi for helping with the graphic design, and to the administrative staff of the Dipartimento di Economia of Parma: Antonella De Falco, Pierluigi Maestri, Anna Magnani, Luisella Notari, Giovanna Oppimitti, Raffaella Rebecchi, and Cinzia Ugolotti. The editors are grateful to Lois Clegg and Catriona Grant for the aid provided in the copyediting, and also to Antonella Campanini, Peter Scholiers, and Jean-Pierre Williot for the remarks made to the first...
You are not authenticated to view the full text of this chapter or article.
This site requires a subscription or purchase to access the full text of books or journals.
Do you have any questions? Contact us.Or login to access all content.